The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Nov. 26, 2012
Applicants:
Lingfei Meng, Redwood City, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Sapna A. Shroff, Menlo Park, CA (US);
Inventors:
Lingfei Meng, Redwood City, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Sapna A. Shroff, Menlo Park, CA (US);
Assignee:
Ricoh Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); G06T 7/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0018 (2013.01); H04N 17/002 (2013.01); G06T 2207/10052 (2013.01); H04N 5/2254 (2013.01);
Abstract
Calibration for plenoptic imaging systems. The calibration preferably is performed automatically by a processor. In one approach, the processor accesses a plenoptic image captured by the plenoptic imaging system. The plenoptic image is analyzed to determine reference points for superpixels of the plenoptic imaging system, for example the centers of the superpixels. The reference points are used to determine a location of each superpixel relative to the detector array.