The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jul. 28, 2014
Applicants:
Kelce S. Wilson, Murphy, TX (US);
Susan M. Gaschke, Beaverton, OR (US);
Lawrence Plonsker, Lake Worth, FL (US);
Inventors:
Kelce S. Wilson, Murphy, TX (US);
Susan M. Gaschke, Beaverton, OR (US);
Lawrence Plonsker, Lake Worth, FL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); A61B 5/00 (2006.01); G06T 11/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61B 5/0033 (2013.01); G06T 5/50 (2013.01); G06T 7/0012 (2013.01); G06T 11/001 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/30036 (2013.01); G06T 2210/41 (2013.01);
Abstract
Systems and methods are disclosed which enable more accurate examination of industrial diagnostic images, for example x-ray, ultrasound and terahertz camera images. The systems and methods highlight anomalies that have changed between the collection times of two or more diagnostic images, and can also provide objective scoring of the degree of change.