The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Aug. 15, 2014
Applicant:

Verance Corporation, San Diego, CA (US);

Inventors:

Rade Petrovic, San Diego, CA (US);

Babak Tehranchi, San Diego, CA (US);

Joseph M. Winograd, San Diego, CA (US);

Kanaan Jemili, San Diego, CA (US);

Assignee:

Verance Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 1/00 (2006.01); G10L 19/018 (2013.01); H04N 1/32 (2006.01); G09C 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 1/005 (2013.01); G06T 1/0028 (2013.01); G06T 1/0071 (2013.01); G09C 5/00 (2013.01); G10L 19/018 (2013.01); H04N 1/32203 (2013.01); H04N 1/32245 (2013.01); H04N 1/32299 (2013.01); H04N 1/32315 (2013.01); G06T 2201/0202 (2013.01); H04L 2209/608 (2013.01); H04N 2201/3233 (2013.01);
Abstract

Methods and devices are provided to thwart analysis of a watermarking system by preventing analysis of watermarks in a host content. Upon receiving a content at a watermark embedding device, the content is analyzed to ascertain whether one or more test features are present in at least a first portion of the received content. When the analysis reveals that one or more test features are present, embedding of watermarks in at least the first portion of the received content is disabled. The test features of interest include a temporal, a spatial and/or a frequency characteristic such that, if a region of the content that includes test feature is embedded with a watermark, at least one characteristic of the embedded watermark is detectable upon analysis of that region. The test feature can, for example, approximate an impulse signal, a step function signal or a pure sinusoidal signal.


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