The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Sep. 14, 2012
David Justin Ross, Redmond, WA (US);
Brian J. Elmenhurst, Redmond, WA (US);
David Justin Ross, Redmond, WA (US);
Brian J. Elmenhurst, Redmond, WA (US);
RAF Technology, Inc., Redmond, WA (US);
Abstract
A method/apparatus for identifying an object based on a pattern of structural features located in a particular region wherein the pattern comprises at least one fingerprint feature. The region may be recognized and used to identify the object. A first feature vector (FV) may be extracted from a first image of the pattern and may be mapped to an object identifier. To authenticate the object, a second FV may be extracted from a second image of the same region. The FVs may be compared and difference(s) determined. A match correlation value (MCV) may be calculated based on the difference(s). The difference(s) may be dampened if associated with expected wear and tear reducing the impact of the difference(s) on the MCV. The differences may be enhanced if associated with changes that are not explainable as wear and tear increasing the impact of the difference(s) on the MCV.