The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Sep. 20, 2012
Applicants:

David Kung, Cupertino, CA (US);

Min He, San Jose, CA (US);

Mengdan MA, Berkeley, CA (US);

Inventors:

David Kung, Cupertino, CA (US);

Min He, San Jose, CA (US);

Mengdan Ma, Berkeley, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30 (2013.01); G06F 17/3051 (2013.01);
Abstract

In an example embodiment, a method of automatically generating data validation rules from data stored in a column of a table is provided. Outliers for the data are determined by analyzing a profiling statistic for the data, the profiling statistic having a type. Then it is determined if a predefined limit is exceeded, based on a quantity of the outliers determined for the data through the analysis of the profiling statistic. A data validation rule is then automatically generated based on non-outliers detected in the data through the analysis of the profiling statistic, the generated data validation rule also being based on the type of the profiling statistic. The data validation rule can then be applied to data subsequently entered for the column, causing at least a portion of the data subsequently entered for the column to be rejected.


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