The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
May. 14, 2009
Kenny C. Gross, San Diego, CA (US);
Ramakrishna C. Dhanekula, San Diego, CA (US);
Aleksey M. Urmanov, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Ramakrishna C. Dhanekula, San Diego, CA (US);
Aleksey M. Urmanov, San Diego, CA (US);
ORACLE AMERICA, INC., Redwood Shores, CA (US);
Abstract
One embodiment provides a system that analyzes telemetry data from a monitored system. During operation, the system periodically obtains the telemetry data as a set of telemetry variables from the monitored system and updates a multidimensional real-time distribution of the telemetry data using the obtained telemetry variables. Next, the system analyzes a statistical deviation of the multidimensional real-time distribution from a multidimensional reference distribution for the monitored system using a multivariate sequential probability ratio test (SPRT) and assesses the integrity of the monitored system based on the statistical deviation of the multidimensional real-time distribution. If the assessed integrity falls below a threshold, the system determines a fault in the monitored system corresponding to a source of the statistical deviation.