The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Sep. 26, 2013
Applicant:

Texas Instruments, Incorporated, Dallas, TX (US);

Inventors:

Anshul Gahoi, Bangalore, IN;

Raghavendra Santhanagopal, Bangalore, IN;

Pradeep Kumar Babu, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/44 (2006.01); G01R 31/28 (2006.01); G01R 27/28 (2006.01); G06F 11/27 (2006.01); G01R 13/28 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G01R 13/28 (2013.01); G06F 9/44 (2013.01); G06F 17/5027 (2013.01); G06F 17/5054 (2013.01);
Abstract

A programmable interface-based validation and debug system includes, for example, a test connector that is arranged to communicatively couple a design under test to the test fixture. A programmable logic interface is communicatively coupled to the test connector and is arranged to receive a downloadable test bench, where the downloadable test bench is arranged to apply test vectors from a first set of test vectors to a first test control bus. A multiplexer is arranged to selectively couple one of the first test control bus and a second test control bus to a shared test bus that is coupled to the test connector, where the second test control bus is arranged to apply test vectors from a second set of test vectors provided by, for example, a debugger that is operated by a human.


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