The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Apr. 08, 2013
Fujitsu Limited, Kawasaki-shi, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
With a command delay time measurement unit that issues a first test command while the medium error status generator generates the medium error status, and measures a delay time of a command response for the first test command as a command delay time, and a response interval measurement unit that issues a plurality of second test commands to the storage apparatuses to be examined under a higher load when no error occurs, and measures an interval of each command response for the plurality of second test commands as a response interval, and by calculating, for each of the plurality of types of the storage apparatuses, a reference time for each storage apparatus type by adding the command delay time and the response interval, an error can be detected more efficiently.