The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Oct. 09, 2014
Applicant:

Dssd, Inc., Menlo Park, CA (US);

Inventors:

Todor Ivanov Mollov, Mountain View, CA (US);

Jeffrey S. Bonwick, Santa Clara, CA (US);

Assignee:

DSSD, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 3/0619 (2013.01); G06F 3/0647 (2013.01); G06F 3/0689 (2013.01);
Abstract

A method for calculating parity values including calculating a first set of parity values using datum stored in RAID Grid locations in a first PCB, where datum associated with the RAID Grid locations in the first PCB is obtained in a first order that is based on a Hilbert curve. The method further includes calculating a second set of parity values using datum stored in RAID Grid locations in a second PCB, where datum associated with the RAID Grid locations in the second PCB is obtained in a second order that is based on the Hilbert curve. The method further includes storing at least a portion of the first set of parity values and a second set of parity values in a cache, memory, or persistent storage, where each of the first parity values and second parity values is associated with a separate RAID Grid location in the RAID Grid.


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