The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Sep. 30, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Pu Wang, Shanghai, CN;
Kent J. Costa, Cary, NC (US);
Kenny Zhou, Shanghai, CN;
Hansi Wu, Shanghai, CN;
Chuangxian Wei, Shanghai, CN;
Qi Mao, Shanghai, CN;
Ye Zhang, Shanghai, CN;
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 5/00 (2006.01); G06F 3/06 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0689 (2013.01); G06F 3/0619 (2013.01); G06F 3/0665 (2013.01); G06F 11/1435 (2013.01);
Abstract
A technique for verifying the consistency of slice allocation metadata includes accessing, from user space of an operating system running on the data storage apparatus, a set of drivers running in kernel space of the operating system to obtain slice allocation metadata from the set of drivers, and identifying discrepancies in slice allocation metadata returned from the set of drivers on a per-file-system basis.