The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Jun. 30, 2012
Applicants:

Xiangping Chen, Shrewsbury, MA (US);

Miles A. DE Forest, Bahama, NC (US);

Thomas E. Linnell, Northborough, MA (US);

Dennis Thomas Duprey, Raleigh, NC (US);

Khang Can, Framingham, MA (US);

Inventors:

Xiangping Chen, Shrewsbury, MA (US);

Miles A. de Forest, Bahama, NC (US);

Thomas E. Linnell, Northborough, MA (US);

Dennis Thomas Duprey, Raleigh, NC (US);

Khang Can, Framingham, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0644 (2013.01); G06F 3/0665 (2013.01); G06F 3/0613 (2013.01); G06F 3/0614 (2013.01);
Abstract

A method, computer program product, and computing system for comparing at least one performance benchmark to at least one performance indicator for a front end LUN. If the at least one performance indicator exceeds the at least one performance benchmark, the failure domain of the front end LUN is reduced. If the at least one performance indicator does not exceed the performance benchmark, the failure domain of the front end LUN is increased.


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