The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Feb. 15, 2013
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Craig Anthony Johnston, Livermore, CA (US);

Vinod Daga, Santa Clara, CA (US);

Subramaniam Periyagaram, Campbell, CA (US);

Alexander James Gronbach, San Luis Obispo, CA (US);

Bharadwaj Vellore Ramesh, Sunnyvale, CA (US);

Assignee:

NetApp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0641 (2013.01); G06F 3/0608 (2013.01); G06F 3/0673 (2013.01);
Abstract

Techniques for a method of estimating deduplication potential are disclosed herein. The method includes steps of selecting randomly a plurality of data blocks from a data set as a sample of the data set, collecting fingerprints of the plurality of data blocks of the sample, identifying duplicates of fingerprints of the sample from the fingerprints of the plurality of data blocks, estimating a total number of unique fingerprints of the data set depending on a total number of the duplicates of fingerprints of the sample based on a probability of fingerprints from the data set colliding in the sample, and determining a total number of duplicates of fingerprints of the data set depending on the total number of the unique fingerprints of the data set.


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