The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jul. 07, 2011
Masashi Okabe, Tokyo, JP;
Naohiro Ariga, Tokyo, JP;
Masashi Okabe, Tokyo, JP;
Naohiro Ariga, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A microscope system including a stage on which a specimen is mounted and that can be moved in a direction that intersects with an optical axis of illumination light irradiated on the specimen; an observation optical system that acquires an image of the specimen on which the illumination light is irradiated; a viewing-range setting unit that sets a viewing range of the image acquired by the observation optical system and displayed on a display unit; a ratio calculating unit that calculates a ratio of the viewing range of the image, which is set by the viewing-range setting unit, relative to a maximum image-acquisition area that can be captured by the observation optical system; and a stage controller that controls a moving speed of the stage in accordance with the ratio calculated by the ratio calculating unit.