The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Jul. 31, 2008
Applicant:

Yanis Caritu, Saint Joseph la Riviere, FR;

Inventor:

Yanis Caritu, Saint Joseph la Riviere, FR;

Assignee:

MOVEA, Grenoble, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/00 (2006.01); G01P 15/18 (2013.01); G01P 15/08 (2006.01); G06F 1/16 (2006.01); G06F 3/01 (2006.01); H04M 1/725 (2006.01);
U.S. Cl.
CPC ...
G01P 15/18 (2013.01); G01P 15/0891 (2013.01); G06F 1/163 (2013.01); G06F 1/1616 (2013.01); G06F 1/1626 (2013.01); G06F 1/1684 (2013.01); G06F 3/017 (2013.01); G06F 2200/1636 (2013.01); H04M 1/7253 (2013.01); H04M 2250/12 (2013.01);
Abstract

The device for detecting percussion events (DISP) comprises at least one axial accelerometer sensor (ACC, ACC, ACC), characterized in that it also comprises at least one additional axial sensor insensitive to the translational vibrations (MAGN, MAGN), for measuring an information item representative of the orientation of the device (DISP) relative to a vector field of known direction within a fixed coordinate system not linked to the device (DISP), and low cut-off filtering means (FILTCB) provided with at least one input receiving measurements transmitted by the axial sensor or sensors (ACC, ACC, ACC, MAGN, MAGN), means (AN) of analyzing the measurements filtered by said low cut-off filtering means (FILTCB), comprising comparison means (COMP) for comparing data from the analysis means (AN) with one or two thresholds (SP, SN).


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