The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jul. 13, 2012
Jeremy Hammond, Gorham, ME (US);
Dominic Pelletier, Raymond, ME (US);
Jason Aguiar, Portland, ME (US);
Jeremy Hammond, Gorham, ME (US);
Dominic Pelletier, Raymond, ME (US);
Jason Aguiar, Portland, ME (US);
IDEXX Laboratories, Inc., Westbrook, ME (US);
Abstract
An automated method for calibrating in real time a diagnostic analyzer includes the steps of receiving diagnostic results of patient samples calculated by the analyzer using pre-set parameters of the analyzer, and calculating the centroid of the analyzer's diagnostic results. The centroid of the analyzer's diagnostic results is subtracted from a centroid of diagnostic results of a field population of comparable analyzers to obtain a bias in the centroid of the analyzer's diagnostic results. The bias is compared to predetermined limits. Should the bias fall outside the predetermined limits, an optimization factor is derived and applied to the analyzer's diagnostic results to obtain optimized results from the analyzer without changing the pre-set parameters of the analyzer.