The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Nov. 08, 2011
Applicant:
Peter Lindner, Langquaid, DE;
Inventor:
Peter Lindner, Langquaid, DE;
Assignee:
KRONES AG, Neutraubling, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/90 (2006.01); G01N 21/93 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/00 (2013.01); G01N 21/90 (2013.01); G01N 21/93 (2013.01); G01N 2021/8832 (2013.01);
Abstract
A method for checking an inspection device for a product flow, where the proper functioning of the inspection device can be checked even without using test containers specially provided for such checking, and having a radiation detector for measuring an inspection radiation after interacting with the products in order to detect a characteristic test radiation, and a further check is made as to whether the detected test radiation fulfills a target requirement characteristic of proper functioning of the inspection device.