The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2015

Filed:

Mar. 01, 2012
Applicant:

Yoru Wada, Muroran, JP;

Inventor:

Yoru Wada, Muroran, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 17/00 (2006.01); G01N 33/20 (2006.01); G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
G01N 17/00 (2013.01); G01N 3/32 (2013.01); G01N 33/20 (2013.01); G01N 2203/0066 (2013.01); G01N 2203/0073 (2013.01); G01N 2203/0232 (2013.01);
Abstract

In a method of determining a fatigue crack lifetime of a low-alloy steel material coming in contact with high-pressure hydrogen in a high-pressure hydrogen environment, estimate a fatigue crack acceleration starting point Kof the low-alloy steel material using a crack-growth threshold stress intensity factor Kobtained through a rising load test on the low-alloy steel material in a high-pressure hydrogen environment. The high-pressure hydrogen environment of the rising load test is a high-pressure hydrogen environment which has the same pressure and atmosphere as in the high-pressure hydrogen environment in which Kis estimated and in which the test temperature tolerance between both environments is ±5° C.


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