The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jun. 20, 2012
Wei Yang, Cupertino, CA (US);
Patrick J. Tang, Fremont, CA (US);
Zhuo Gao, Palo Alto, CA (US);
Liu Zhongzhou, Shenzhen, CN;
Ali-reza Bahmandar, San Jose, CA (US);
Wei Yang, Cupertino, CA (US);
Patrick J. Tang, Fremont, CA (US);
Zhuo Gao, Palo Alto, CA (US);
Liu Zhongzhou, Shenzhen, CN;
Ali-Reza Bahmandar, San Jose, CA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
A combinatorial test device is configurable to contemporaneously test one or more sensors of output devices free from user intervention. A device under test such as a user device is placed in a test fixture of the combinatorial test device. Under the control and monitoring of a test controller testing takes place. The testing may be performed for quality assurance after assembly or repair, or to determine the reliability of the device such as by testing the device until a particular life cycle value is reached or a component in the device fails.