The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Nov. 19, 2013
Applicant:
Mori Seiki Co., Ltd., Nara, JP;
Inventors:
Assignee:
Mori Seiki Co., LTD., Nara, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/08 (2006.01); G01M 3/04 (2006.01); G01M 3/32 (2006.01);
U.S. Cl.
CPC ...
G01M 3/04 (2013.01); G01M 3/3272 (2013.01);
Abstract
Methods and apparatus for detecting machine tool window airtightness includes an airtight state detector, having a sensor detecting the pressure in a space of the window, and a judging section for determining appropriateness of the airtight state of the space based on a pressure value from the pressure sensor and outputting a judgment result. Pressure in the window space, which initially may be pressurized or pressure-reduced, is detected intermittently by the pressure sensor, and the judging section determines appropriateness of the airtight state of the window on the basis of a variation state of the detected pressure.