The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2015
Filed:
Jul. 10, 2012
Kentaro Sekiyama, Tokyo, JP;
Kentaro Sekiyama, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is a wavelength distribution measuring apparatus (), which includes a diffuser plate () for dispersing light beams radiated from an object to be measured () and a light beam homogenizing optical element () for reflecting, by the side surface (), at least part of the light beams dispersed by the diffuser plate () so that the light beams approximate to the direction of the perpendicular of a light receiving surface and also for guiding the light beams to the light receiving surface, and an optical receiver () including a plurality of light receiving elements for detecting the light beams, the light receiving elements being different from one another in spectral sensitivity characteristic. With this configuration, substantially parallel light beams radiated from the object to be measured () are homogenized at the light receiving surface including the periphery of the light receiving surface.