The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jun. 18, 2012
Applicants:
Chih-li Wang, New Taipei, TW;
Ming-jen Chan, New Taipei, TW;
Yi-cheng Lee, New Taipei, TW;
Inventors:
Assignee:
Wistron Corp., New Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); H04N 13/04 (2006.01); H04N 17/04 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0438 (2013.01); H04N 17/04 (2013.01);
Abstract
A testing system including a preset display device, preset shutter glasses and a testing device is disclosed. The preset display device generates a synchronization signal and outputs a timing signal relating to the synchronization signal. The preset shutter glasses receive the synchronization signal to generate a masking signal. The testing device processes the timing signal and the masking signal according to a setting signal and determines whether the preset shutter glasses are normal according to the processed result.