The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
May. 17, 2013
Jx Nippon Oil & Energy Corporation, Tokyo, JP;
Toda Kogyo Corp., Hiroshima, JP;
Takashi Suzuki, Kanagawa, JP;
Noriyo Ishimaru, Kanagawa, JP;
Takashi Oyama, Yamaguchi, JP;
Tamotsu Tano, Yamaguchi, JP;
Toshiyuki Oda, Yamaguchi, JP;
Ippei Fujinaga, Yamaguchi, JP;
Tomoaki Urai, Hiroshima, JP;
Seiji Okazaki, Hiroshima, JP;
Katsuaki Kurata, Hiroshima, JP;
Toshiaki Hiramoto, Hiroshima, JP;
Akino Sato, Hiroshima, JP;
Wataru Oda, Hiroshima, JP;
JX NIPPON OIL & ENERGY CORPORATION, Tokyo, JP;
TODA KOGYO CORP., Hiroshima, JP;
Abstract
A method for producing an amorphous carbon material for a negative electrode of a lithium-ion secondary battery includes the steps of; pulverizing and classifying a raw coke composition obtained from a heavy-oil composition undergone coking by delayed coking process to obtain powder of the raw coke composition, the raw coke composition having a H/C atomic ratio that is a ratio of hydrogen atoms H and carbon atoms C of 0.30 to 0.50 and having a micro-strength of 7 to 17 mass %; giving compressive stress and shear stress to the powder of the raw coke composition to obtain a carbonized composition precursor; and heating the carbonized composition precursor under an inert atmosphere at a temperature from 900° C. to 1,500° C. so that a size of a crystallite Lc(002) is in a range of 2 nm to 8 nm, the size being calculated from a (002) diffraction line obtained by X-ray wide-angle diffractometry.