The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jul. 27, 2012
Applicant:
Shiki Takabayashi, Tokyo, JP;
Inventor:
Shiki Takabayashi, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06T 7/00 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0018 (2013.01); G06T 7/0057 (2013.01); G01B 11/2518 (2013.01); G06T 2207/30204 (2013.01);
Abstract
A three-dimensional measurement apparatus includes a detection unit configured to detect, in an image captured by a capture unit, position information of a pattern on a capture pixel surface, which is projected to a plurality of pattern detection areas preset on the same plane in a measurement space, and a corresponding relationship calculation unit configured to calculate, using the position information, a corresponding relationship between the pattern on a projection pixel surface of a projection unit detected in advance before measurement and the pattern on the projection pixel surface of the projection unit at the time of measurement.