The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Mar. 15, 2013
Amir Averbuch, Tel Aviv, IL;
Amit Bermanis, Rehovot, IL;
Ronald R. Coifman, North-Haven, CT (US);
ThetaRay Ltd., Hod Hashron, IL;
Abstract
A method for classification of a newly arrived multidimensional data point (MDP) in a dynamic data uses multi-scale extension (MSE). The multi-scale out-of-sample extension (OOSE) uses a coarse-to-fine hierarchy of the multi-scale decomposition of a Gaussian kernel that established the distances between MDPs in a training set to find the coordinates of newly arrived MDPs in an embedded space. A well-conditioned basis is first generated in a source matrix of MDPs. A single-scale out-of-sample extension (OOSE) is applied to the newly arrived MDP on the well-conditioned basis to provide coordinates of an approximate location of the newly arrived MDP in an embedded space. A multi-scale OOSE is then applied to the newly arrived MDP to provide improved coordinates of the newly arrived MDP location in the embedded space.