The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Sep. 28, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Radislav Alexandrovich Potyrailo, Niskayuna, NY (US);

Jeffrey Michael Ashe, Gloversville, NY (US);

Sm Shajed Hasan, Niskayuna, NY (US);

Naresh Kesavan Rao, Clifton Park, NY (US);

Krishnakumar Sundaresan, Clifton Park, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01); G06K 19/07 (2006.01); G06K 19/077 (2006.01);
U.S. Cl.
CPC ...
G06K 19/0717 (2013.01); G06K 19/0723 (2013.01); G06K 19/07749 (2013.01);
Abstract

A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.


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