The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Sep. 11, 2013
Applicant:

Digitalglobe, Inc., Longmont, CO (US);

Inventors:

Giovanni B. Marchisio, Longmont, CO (US);

Carsten Tusk, Longmont, CO (US);

Krzysztof Koperski, Longmont, CO (US);

Mark D. Tabb, Longmont, CO (US);

Jeffrey D. Shafer, Longmont, CO (US);

Assignee:

DigitalGlobe, Inc., Longmont, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06F 17/30 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6269 (2013.01); G06F 17/30241 (2013.01); G06K 9/4604 (2013.01); G06K 9/4642 (2013.01);
Abstract

Land classification based on analysis of image data. Feature extraction techniques may be used to generate a feature stack corresponding to the image data to be classified. A user may identify training data from the image data from which a classification model may be generated using one or more machine learning techniques applied to one or more features of the image. In this regard, the classification module may in turn be used to classify pixels from the image data other than the training data. Additionally, quantifiable metrics regarding the accuracy and/or precision of the models may be provided for model evaluation and/or comparison. Additionally, the generation of models may be performed in a distributed system such that model creation and/or application may be distributed in a multi-user environment for collaborative and/or iterative approaches.


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