The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Feb. 21, 2013
Applicant:

Htc Corporation, Taoyuan County, TW;

Inventors:

Ching-Fu Lin, Taoyuan County, TW;

Chia-Wei Chiu, Taoyuan County, TW;

Kuo-Hsien Liang, Taoyuan County, TW;

Assignee:

HTC Corporation, Taoyuan District, Taoyuan, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/32 (2013.01); G06K 9/6204 (2013.01); G06T 7/0028 (2013.01); G06T 2207/20016 (2013.01);
Abstract

An image alignment method includes steps of receiving a first image and a second image; scaling the first image and the second image by a ratio to generate a first downsized image and a second downsized image respectively; determining a first offset between the first downsized image and the second downsized image; selecting a first saliency region and a second saliency region from the first downsized image and the second downsized image; determining a second offset between a first sub-region within the first image and a second sub-region within the second image, the first sub-region and the second sub-region corresponding to the first saliency region and the second saliency region respectively; determining a final offset according to the ratio, the first offset and the second offset; and aligning the first image and the second image by the final offset.


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