The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jan. 31, 2015
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Brent Boe, San Francisco, CA (US);
Alok Anant Bhide, Mountain View, CA (US);
Sonal Maheshwari, Los Altos, CA (US);
Assignee:
Splunk, Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 17/30 (2006.01); G06F 9/54 (2006.01); H04L 12/24 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30477 (2013.01); G06F 9/542 (2013.01); H04L 41/0213 (2013.01);
Abstract
A computer system determines if events in a machine data store satisfy event selection criteria, the event selection criteria including a first field-value pair. To determine if one of the events satisfies the event selection criteria, the computer system compares the first field-value pair of the event selection criteria with a second field-value pair from an entity definition associated with the event by using a third field-value pair from data corresponding to the event in the machine data store.