The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Nov. 27, 2013
Oracle America, Inc., Redwood City, CA (US);
William Y. Chen, Los Altos, CA (US);
Jiwei Lu, Pleasanton, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
A method of reproducing runtime environment for debugging an application is disclosed. The method includes accessing an optimizer file from a non-volatile storage medium. The optimizer file includes a runtime environment, application definition information, and a log. The log includes summaries of a plurality of events, the plurality of actions, and a time mark of occurrence for each of the plurality of actions. A runtime environment for debugging the application is then defined and the application runtime is set up using the application definition information in the optimizer file. Further, the method includes running the application and attaching an optimizer, then triggering each of the plurality of actions to occur at each time mark of occurrence associated with the each of the plurality of actions, and analyzing each of the plurality of actions and the plurality of events associated with the each of the plurality of actions, the analyzing includes comparing the events produced by running the application with the plurality of events in the optimizer file. If a fault is produced by the triggering, a debugger is invoked to analyze the fault.