The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Jul. 01, 2013
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventor:

Michael J Jones, Belmont, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/076 (2013.01);
Abstract

A method detects anomalies in time series data by comparing universal features extracted from testing time series data with the universal features acquired from training time series data to determine a score. The universal features characterize trajectory components of the time series data and stochastic components of the time series data. Then, an anomaly is detected if the anomaly score is above a threshold.


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