The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jun. 29, 2012
Radu Rugina, Sunnyvale, CA (US);
Ricardo E. Gonzalez, Portola Valley, CA (US);
Alok Kataria, Sunnyvale, CA (US);
Doug Covelli, Cambridge, MA (US);
Robert Benson, San Francisco, CA (US);
Matthias Hausner, Belmont, CA (US);
Radu Rugina, Sunnyvale, CA (US);
Ricardo E. Gonzalez, Portola Valley, CA (US);
Alok Kataria, Sunnyvale, CA (US);
Doug Covelli, Cambridge, MA (US);
Robert Benson, San Francisco, CA (US);
Matthias Hausner, Belmont, CA (US);
VMware, Inc., Palo Alto, CA (US);
Abstract
Probes are instrumented in multiple software modules of a computer system having virtual machines running therein and executed in a coordinated manner. An output of one probe may be used to conditionally trigger another probe so that the precision of collected data may be improved. In addition, outputs of probes that are triggered in different software modules by related events may be synchronized and analyzed collectively. Probes also may be parallel processed in different processors so that multiple probes can be processed concurrently.