The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Aug. 20, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kazutaka Inoguchi, Tokyo, JP;

Masakazu Tohara, Komae, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/14 (2006.01); G02B 27/01 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0172 (2013.01); G02B 5/30 (2013.01); G02B 2027/015 (2013.01); G02B 2027/0123 (2013.01);
Abstract

An observation optical system configured to guide light from a plurality of original images to an exit pupil to present a combined overall image of the plurality of original images, includes a first optical element including a first off-axial reflecting surface configured to reflect at least a portion of light, a second optical element including a second off-axial reflecting surface configured to reflect at least a portion of light, and a off-axial optical system which overlaps at the pupil light fluxes from positions on the respective original images that have an identical angle-of-view, wherein the second optical element is cemented with the first optical element in at least a portion of the first off-axial reflecting surface, and wherein the cemented surface is a surface which reflects at least a portion of light and transmits at least a portion of light.


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