The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Apr. 09, 2013
Applicant:

Leica Microsystems (Schweiz) Ag, Heerbrugg, CH;

Inventors:

Robert Lettow, Winterthur, CH;

Paul Gräfenhain, Heerbrugg, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 5/00 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 5/005 (2013.01); G02B 21/082 (2013.01);
Abstract

A diaphragm arrangement () for generating an oblique illumination in a microscope comprises a carrier element (), an iris diaphragm element () having a variable iris diaphragm opening (), a further diaphragm element () having a diaphragm opening () that, when it is in a first position relative to the carrier element (), covers a portion of the iris diaphragm opening () and is mounted rotatably around a first rotation axis (A), such that a rotation of the further diaphragm element () around the first rotation axis (A) changes that portion of the iris diaphragm opening () which is covered by the further diaphragm element (), and an actuation element () coupled to the further diaphragm element () via a coupling device () such that a rotation of the further diaphragm element () around the first rotation axis (A) is produced by an actuation of the actuation element ().


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