The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Aug. 28, 2012
Applicant:

Masanao Kamata, Tokyo, JP;

Inventor:

Masanao Kamata, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/20 (2006.01); G02B 21/00 (2006.01); G01N 21/63 (2006.01); G01J 1/42 (2006.01); G02B 13/14 (2006.01); G01N 21/3586 (2014.01);
U.S. Cl.
CPC ...
G02B 21/0016 (2013.01); G01J 1/42 (2013.01); G01N 21/63 (2013.01); G02B 13/14 (2013.01); G01N 21/3586 (2013.01);
Abstract

[Object] To provide a terahertz emission microscope being capable of improving a detection accuracy of a terahertz electromagnetic wave, a photoconductive element and a lens used therefor, and a method of producing a device. [Solving Means] A photoconductive element includes a base material, electrodes and a film material. The base material has an incident surface on which a terahertz electromagnetic wave is incident, the terahertz electromagnetic wave generated by irradiating a device to be observed with a pulse laser generated from a light source. The electrodes are formed on the base material and detect the terahertz electromagnetic wave incident on the incident surface of the base material. The film material is formed on the incident surface of the base material, transmits the terahertz electromagnetic wave and reflects the pulse laser.


Find Patent Forward Citations

Loading…