The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

Mar. 15, 2012
Applicants:

Hugues A. Djikpesse, Cambridge, MA (US);

Michael David Prange, Somerville, MA (US);

Mohamed-rabigh Khodja, Quincy, MA (US);

Sebastien Duchenne, Montpellier, FR;

Henry Menkiti, Twickenham, GB;

Inventors:

Hugues A. Djikpesse, Cambridge, MA (US);

Michael David Prange, Somerville, MA (US);

Mohamed-Rabigh Khodja, Quincy, MA (US);

Sebastien Duchenne, Montpellier, FR;

Henry Menkiti, Twickenham, GB;

Assignee:

WesternGeco L.L.C., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/28 (2013.01); G01V 1/30 (2013.01); G01V 2210/66 (2013.01); G01V 2210/72 (2013.01);
Abstract

Complex-valued sensitivity data structures corresponding to respective candidate survey settings are provided, where the sensitivity data structures relate measurement data associated with a target structure to at least one parameter of a model of the target structure. Based on the sensitivity data structures, a subset of the candidate survey settings is selected according to a criterion for enhancing resolution in characterizing the target structure.


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