The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Jul. 19, 2012
Kwang-eun Jang, Busan, KR;
Jong-ha Lee, Hwaseong-si, KR;
Kang-eui Lee, Yongin-si, KR;
Young-hun Sung, Hwaseong-si, KR;
Kwang-eun Jang, Busan, KR;
Jong-ha Lee, Hwaseong-si, KR;
Kang-eui Lee, Yongin-si, KR;
Young-hun Sung, Hwaseong-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An X-ray imaging apparatus and method is provided. An X-ray imaging apparatus includes an X-ray radiation unit configured to radiate a first X-ray and a second X-ray onto a target along a predetermined path, an X-ray detection unit configured to detect the radiated first X-ray and the second X-ray that have passed through the target, and an image data generation unit configured to generate cross-section data that respectively corresponds to the detected first X-ray and the detected second X-ray and represents a predetermined cross-sectional layer of the target. The first X-ray is radiated at a location on the predetermined path that is different from a location on the predetermined path at which the second X-ray is radiated, the first X-ray including X-ray spectra that are different from X-ray spectra of the second X-ray.