The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
May. 16, 2013
Wyatt Technology Corporation, Santa Barbara, CA (US);
Daniel I. Some, Santa Barbara, CA (US);
David N. Villalpando, Lompoc, CA (US);
WYATT TECHNOLOGY CORPORATION, Santa Barbara, CA (US);
Abstract
Various embodiments of integrated measurement cell systems for the simultaneous or near simultaneous measurement of light scattering and UV absorption measurements, and methods of their use, are disclosed. In the flow cell implementations, the height of the measurement cell is traversed by the UV beam multiple times by beam directing optics, allowing thereby, the accurate determination of concentration present in the integrated flow cell and allowing the user to select the desired sensitivity which is proportional to the number of passes the beam makes through the cell. Batch implementations also allow for near simultaneous measurement of light scattering and UV absorption within the cuvette. These embodiments aid in the reduction or elimination of errors due to interdetector band broadening while also decreasing the amount of sample required and improving design flexibility of integrated measurement systems.