The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Nov. 01, 2013
Applicants:
Yokogawa Electric Corporation, Musashino-shi, Tokyo, JP;
Yokogawa Meters & Instruments Corporation, Tachikawa-shi, Tokyo, JP;
Inventors:
Toshikazu Yamamoto, Tachikawa, JP;
Manabu Kojima, Tachikawa, JP;
Assignees:
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
YOKOGAWA METERS & INSTRUMENTS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/45 (2006.01); G01J 9/02 (2006.01);
U.S. Cl.
CPC ...
G01J 9/0246 (2013.01);
Abstract
An optical wavelength meter includes: an interferometer; a reference optical source unit with a laser configured to oscillate in a multi-longitudinal mode; and a signal processor configured to calculate a wavelength of a input beam with reference to interference fringe information of reference beam and interference fringe information of the input beam obtained from the interferometer.