The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

May. 17, 2011
Applicants:

Michael Hanko, Dresden, DE;

René Kündscher, Radeburg, DE;

Torsten Pechstein, Radebeul, DE;

Inventors:

Michael Hanko, Dresden, DE;

René Kündscher, Radeburg, DE;

Torsten Pechstein, Radebeul, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 11/24 (2006.01); G01N 27/333 (2006.01);
U.S. Cl.
CPC ...
G01D 11/245 (2013.01); G01N 27/333 (2013.01);
Abstract

A probe arrangement, in the case of which a probe is arranged within a tubular housing, wherein the tubular housing has at least one process window open to the process medium, and at least one functional element is secured on the probe and surrounded by the process medium. In order to suppress a taking along of the process medium during transfer of the functional element from the measured medium into a rinsing chamber, the tubular housing includes at least one treatment window open opposite the probe (), preferably for washing, rinsing and/or calibrating the functional element, wherein the functional element is movable between the process window and the treatment window, and, during the measuring in the process medium, the at least one functional element is arranged approximately coincident with the at least one process window of the housing.


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