The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2015

Filed:

May. 19, 2014
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Bernhard Winkler, Regensburg, DE;

Andreas Zankl, Wiesent, DE;

Klemens Pruegl, Regensburg, DE;

Stefan Kolb, Unterschleissheim, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/71 (2006.01); H01L 21/205 (2006.01); H01L 27/04 (2006.01); H01L 27/20 (2006.01); B81B 7/02 (2006.01); B81B 7/00 (2006.01); B81C 1/00 (2006.01); H01L 27/06 (2006.01);
U.S. Cl.
CPC ...
B81B 7/008 (2013.01); B81C 1/00246 (2013.01); H01L 27/0611 (2013.01); B81B 2201/0264 (2013.01); B81B 2203/0315 (2013.01); B81B 2207/015 (2013.01); B81C 2203/0707 (2013.01); B81C 2203/0735 (2013.01); B81C 2203/0771 (2013.01);
Abstract

Embodiments relate to MEMS devices, particularly MEMS devices integrated with related electrical devices on a single wafer. Embodiments utilize a modular process flow concept as part of a MEMS-first approach, enabling use of a novel cavity sealing process. The impact and potential detrimental effects on the electrical devices by the MEMS processing are thereby reduced or eliminated. At the same time, a highly flexible solution is provided that enables implementation of a variety of measurement principles, including capacitive and piezoresistive. A variety of sensor applications can therefore be addressed with improved performance and quality while remaining cost-effective.


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