The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2015
Filed:
Dec. 03, 2009
Applicants:
Rudolf Murai Von Bünau, Jena, DE;
Burkhart Wagner, Jena, DE;
Scott A. Meyer, Livermore, CA (US);
Xunchang Chen, Pleasanton, CA (US);
Inventors:
Rudolf Murai Von Bünau, Jena, DE;
Burkhart Wagner, Jena, DE;
Scott A. Meyer, Livermore, CA (US);
Xunchang Chen, Pleasanton, CA (US);
Assignee:
Carl Zeiss Meditec AG, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/00 (2006.01); A61F 2/16 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61F 2/16 (2013.01);
Abstract
For the pre-operative calculation of the power of an intraocular lens, three input parameters are needed: the axial length of the eye (AL), the refractive power of the cornea, and the distance between the front of the cornea and the back focal plane of the intraocular lens, the so-called effective lens position (ELP). The invention shows a novel approach to the determination of the ELP.