The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Mar. 06, 2013
Applicant:
Leif J. Sandstrom, Madison, AL (US);
Inventor:
Leif J. Sandstrom, Madison, AL (US);
Assignee:
ADTRAN, Inc., Huntsville, AL (US);
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/40 (2013.01); H04B 10/25 (2013.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); H04B 10/2503 (2013.01); H04B 10/40 (2013.01);
Abstract
A small form factor pluggable (SFP) device has an embedded optical time domain reflectometer (OTDR) for detecting anomalies along an optical fiber. The SFP device has a plurality of optical subassemblies (OSAs) that are used to transmit an optical data signal at a first wavelength, transmit an optical OTDR signal at a second wavelength, and receive an optical data signal at a third wavelength. The OTDR signal is effectively isolated from the data signals based on wavelength, and samples of returns of the OTDR signal are analyzed to detect at least one anomaly along the optical fiber.