The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Apr. 08, 2014
Applicants:

Mati Wax, Haifa, IL;

Ariel Yaffe, Ra'anana, IL;

Inventors:

Mati Wax, Haifa, IL;

Ariel Yaffe, Ra'anana, IL;

Assignee:

WAVION, LTD., Yoqne'am-Illit, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/02 (2006.01); H04M 1/00 (2006.01); H04B 1/10 (2006.01); G01S 5/02 (2010.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04B 1/1081 (2013.01); G01S 5/0215 (2013.01); G01S 5/0252 (2013.01); G01S 5/0273 (2013.01); H04W 64/00 (2013.01);
Abstract

Discriminative methods for multipath fingerprinting, enabling single-site localization in rich multipath environments, are provided herein. In contrast to the existing descriptive method that uses only the data of each location for its fingerprint extraction, these methods use also the data of the other locations in the database, and leverage it to make the fingerprint as different as possible from the other fingerprints in the database. The performance of these methods, validated with both simulated and real data, is superior to the existing method, demonstrating localization accuracy of about 1 m in typical indoor environments.


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