The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Oct. 07, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Hideki Yamamoto, Ikeda, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
Prior to multiple reaction monitoring (MRM) measurement condition optimization, an analysis operator prepares, for each precursor ion of an objective compound, two lists on a product-ion selection condition setting screen, i.e. a listwhich shows ions to be preferentially selected as product ions for which the optimization needs to be performed and a listwhich shows ions to be excluded from the optimization. When a measurement is performed, a product-ion scan measurement for the precursor ion of the objective compound is performed and a spectrum is obtained. Among the ions extracted from this spectrum, any ion registered in the excludable-ion listis excluded, while any ion registered in the preferred-ion listis preferentially selected as a product ion. For each combination of the m/z values of the precursor ion and the product ions thus determined, optimum conditions of the MRM measurement are searched for.