The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Feb. 11, 2014
Applicant:
Lsi Corporation, San Jose, CA (US);
Inventors:
Yuqing Yang, Shanghai, CN;
Shaohua Yang, San Jose, CA (US);
Lei Wang, Shanghai, CN;
Gu Zhao, Shanghai, CN;
Assignee:
Avago Technologies General IP (Singapore) PTE. LTD., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 20/10 (2006.01); G11B 5/596 (2006.01);
U.S. Cl.
CPC ...
G11B 20/10222 (2013.01); G11B 5/59655 (2013.01); G11B 20/10296 (2013.01); G11B 2220/2516 (2013.01);
Abstract
Systems and method relating generally to data processing, and more particularly to systems and methods for data synchronization and detection.
Yang, Yuqing. (2015). Systems and methods for end of fragment marker based data alignment (U.S. Patent No. 9142251). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9142251
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile