The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Sep. 13, 2012
Ji Young Park, Daejeon-si, KR;
Kwang Hyun Shim, Daejeon-si, KR;
Seung Woo Nam, Daejeon-si, KR;
Jae Hoo Lee, Daejeon-si, KR;
Myung Ha Kim, Daejeon-si, KR;
Bon Ki Koo, Daejeon-si, KR;
Dong Won Han, Daejeon-si, KR;
Ji Young Park, Daejeon-si, KR;
Kwang Hyun Shim, Daejeon-si, KR;
Seung Woo Nam, Daejeon-si, KR;
Jae Hoo Lee, Daejeon-si, KR;
Myung Ha Kim, Daejeon-si, KR;
Bon Ki Koo, Daejeon-si, KR;
Dong Won Han, Daejeon-si, KR;
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Abstract
Provided is an apparatus and method for obtaining depth information using an optical pattern. The apparatus for obtaining depth information using the optical pattern may include: a pattern projector to generate the optical pattern using a light source and an optical pattern projection element (OPPE), and to project the optical pattern towards an object area, the OPPE comprising a pattern that includes a plurality of pattern descriptors; an image obtaining unit to obtain an input image by photographing the object area; and a depth information obtaining unit to measure a change in a position of at least one of the plurality of pattern descriptors in the input image, and to obtain depth information of the input image based on the change in the position.