The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Dec. 14, 2011
Applicant:

Iwo Willem Oscar Serlie, Noord Brabant, NL;

Inventor:

Iwo Willem Oscar Serlie, Noord Brabant, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 7/0012 (2013.01); G06T 11/206 (2013.01); G06T 2200/24 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/10108 (2013.01); G06T 2207/30096 (2013.01);
Abstract

A tumor of interest is classified based on 3-dimensional image data for visualizing the tumor. The system includes an overlay data structure (OL) for computing a TNM (Tumor-Node-Metastasis) overlay for displaying in a tumor image computed from the image data. The TNM overlay includes TNM information for determining the stage of the tumor. An overlay unit (U) computes the TNM overlay based on the overlay data structure, and positions the TNM overlay on the tumor image. The size of the TNM overlay is based on the scale of the computed tumor image. By making the size of the TNM overlay dependent on the scale of the tumor image, the ratio of the distance between two locations on the positioned TNM overlay to the distance between two locations in the computed tumor image is substantially constant, i.e., substantially independent of the visualization of the image data.


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