The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Oct. 31, 2011
Krishnamurthy Viswanathan, Mountain View, CA (US);
Choudur Lakshminarayan, Austin, TX (US);
Wade J. Satterfield, Fort Collins, CO (US);
Vanish Talwar, Campbell, CA (US);
Chengwei Wang, Atlanta, GA (US);
Krishnamurthy Viswanathan, Mountain View, CA (US);
Choudur Lakshminarayan, Austin, TX (US);
Wade J. Satterfield, Fort Collins, CO (US);
Vanish Talwar, Campbell, CA (US);
Chengwei Wang, Atlanta, GA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Probable anomalies associated with at least one data metric may be detected across a series of windows of time series data by comparison of data to a threshold. An estimated probability of anomalies for each of the windows of time series data may be determined based on the detected probable anomalies and the threshold. The windows of time series data may be ranked based on the estimated probabilities. Probable anomalies associated with highest ranked windows of time series data may be output to a user.