The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2015

Filed:

Mar. 07, 2013
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Raj Kumar Krishna Kumar, Bangalore, IN;

Pawan Kumar Baheti, Bangalore, IN;

Dhananjay Ashok Gore, Bangalore, IN;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/4647 (2013.01); G06K 2209/01 (2013.01);
Abstract

An image of real world is processed to identify blocks as candidates to be recognized. Each block is subdivided into sub-blocks, and each sub-block is traversed to obtain counts, in a group for each sub-block. Each count in the group is either of presence of transitions between intensity values of pixels or of absence of transition between intensity values of pixels. Hence, each pixel in a sub-block contributes to at least one of the counts in each group. The counts in a group for a sub-block are normalized, based at least on a total number of pixels in the sub-block. Vector(s) for each sub-block including such normalized counts may be compared with multiple predetermined vectors of corresponding symbols in a set, using any metric of divergence between probability density functions (e.g. Jensen-Shannon divergence metric). Whichever symbol has a predetermined vector that most closely matches the vector(s) is identified and stored.


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