The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2015
Filed:
Oct. 05, 2012
Carnegie Mellon University, Pittsburgh, PA (US);
Bernardo Rodrigues Pires, Pittsburgh, PA (US);
José M. F. Moura, Pittsburgh, PA (US);
Carnegie Mellon University, Pittsburgh, PA (US);
Abstract
Feature-matching methods for attempting to match visual features in one image with visual features in another image. Feature-matching methods disclosed progressively sample the affine spaces of the images for visual features, starting with a course sampling and iteratively increasing the density of sampling. Once a predetermined threshold number of unambiguous matches has been satisfied, the iterative sampling and matching can be stopped. The iterative sampling and matching methodology is especially, but not exclusively, suited for use in fully affine invariant feature matching applicants and can be particularly computationally efficient for comparing images that have large differences in observational parameters, such as scale, tilt, object-plane rotation, and image-plane rotation. The feature-matching methods disclosed can be useful in object/scene recognition applications. The disclosed methods can be implemented in software and various object/scene recognition systems.